Jump Scan: A DFT Technique for Low Power Testing.
Min-Hao ChiuChien-Mo James LiPublished in: VTS (2005)
Keyphrases
- low power
- low cost
- power consumption
- high speed
- single chip
- wireless transmission
- high power
- low power consumption
- logic circuits
- digital signal processing
- vlsi architecture
- vlsi circuits
- image sensor
- gate array
- signal processor
- cmos technology
- frequency domain
- power dissipation
- power reduction
- discrete fourier transform
- low complexity
- real time