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Computer-Added C-V Measurement and Analysis of Metal/High-κ/Si Structures.

Lihnida Stojanovska-GeorgievskaNenad Novkovski
Published in: ICT Innovations (2011)
Keyphrases
  • statistical analysis
  • image analysis
  • neural network
  • machine learning
  • information retrieval
  • feature selection
  • data structure
  • data analysis
  • steady state
  • personal computer