Review of commercial SiC MOSFET models: Validity and accuracy.
Andrii StefanskyiLukasz StarzakAndrzej NapieralskiPublished in: MIXDES (2017)
Keyphrases
- high accuracy
- statistical models
- complex systems
- databases
- precision and recall
- experimental data
- model selection
- computational cost
- multiscale
- three dimensional
- information retrieval
- neural network
- data sets
- feature space
- computational efficiency
- computational models
- highly accurate
- modeling framework
- predictive power
- accurate models