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CNT-count Failure Characteristics of Carbon Nanotube FETs under Process Variations.

Behnam GhavamiMohsen RajiHossein PedramOmid Naghshineh Arjmand
Published in: DFT (2011)
Keyphrases
  • three dimensional
  • multiscale
  • machine learning
  • carbon nanotubes
  • database
  • neural network
  • information systems
  • e learning
  • image segmentation
  • data model
  • process model
  • carbon dioxide