A General Framework for Class Label Specific Mutual Information Feature Selection Method.
Deepak Kumar RakeshPrasanta K. JanaPublished in: IEEE Trans. Inf. Theory (2022)
Keyphrases
- mutual information
- feature selection
- feature set
- class labels
- similarity measure
- probabilistic model
- classification accuracy
- conditional mutual information
- prior knowledge
- data sets
- em algorithm
- classification algorithm
- data analysis
- support vector machine
- model selection
- text categorization
- information theoretic
- information gain