A new method for verifying sequential circuits.
Kenneth J. SupowitSteven J. FriedmanPublished in: DAC (1986)
Keyphrases
- experimental evaluation
- synthetic data
- pairwise
- classification accuracy
- neural network
- multiscale
- preprocessing
- detection method
- main contribution
- fully automatic
- probabilistic model
- support vector machine
- principal component analysis
- high accuracy
- image quality
- computationally efficient
- support vector machine svm
- clustering method
- feature space
- error rate
- image processing
- high precision
- data sets