VLSI reliability challenges: from device physics to wafer scale systems.
Eiji TakedaKunihiko IkuzakiHisao KattoYuzuru OhjiKenji HinodeAkemi HamadaToshiyuki SakutaTakahiro FunabikiToshio SasakiPublished in: Proc. IEEE (1993)
Keyphrases
- interactive systems
- scale space
- information systems
- signal processing
- current challenges
- multiscale
- high speed
- distributed systems
- learning systems
- complex systems
- computer systems
- vlsi circuits
- medical devices
- technical issues
- biological systems
- integrated circuit
- building blocks
- real time
- low cost
- case study
- artificial intelligence
- data mining