Login / Signup
A yield improvement technique for IC layout using local design rules.
Gerard A. Allan
Anthony J. Walton
Robert J. Holwill
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1992)
Keyphrases
</>
database
engineering design
layout design
neural network
data mining
information systems
decision making
website
web services
case study
computer aided
design decisions