Machine Learning Approach to Characteristic Fluctuation of Bulk FinFETs Induced by Random Interface Traps.
Rajat ButolaYiming LiSekhar Reddy KolaPublished in: ISQED (2022)
Keyphrases
- machine learning
- user interface
- machine learning methods
- learning tasks
- statistical learning
- learning algorithm
- explanation based learning
- support vector machine
- inductive logic programming
- kernel methods
- knowledge representation
- active learning
- pattern recognition
- data analysis
- artificial intelligence
- decision trees
- data sets
- data mining
- randomly generated
- stock market
- feature selection
- machine learning algorithms
- uniformly distributed
- machine learning and data mining
- interface design
- natural language processing
- supervised learning
- machine learning approaches
- database
- visual interface
- human computer interface
- learning problems
- user friendly
- learning systems
- model selection
- computational intelligence
- text mining
- knowledge discovery
- computer vision