Material identification of loose particles in sealed electronic devices using PCA and SVM.
Guofu ZhaiJinbao ChenShujuan WangKang LiLong ZhangPublished in: Neurocomputing (2015)
Keyphrases
- electronic devices
- principal component analysis
- support vector machine svm
- svm classifier
- support vector
- support vector machine
- dimension reduction methods
- principal components analysis
- feature space
- principal components
- knn
- feature selection
- feature extraction
- kernel function
- face recognition
- multi class classification
- smart phones
- dimensionality reduction
- multi class
- principle component analysis
- training set
- kernel pca
- machine learning
- svm classification
- independent component analysis
- discriminant analysis
- linear discriminant analysis
- classification method
- negative matrix factorization
- classification algorithm
- logistic regression
- decision trees
- multi objective