Reliability Prediction of Highly Scaled MOSFET Devices via Fractal Structure of Spatial Defects.

Seong-Joon Kim Man Soo Kim Suk Joo Bae

Published in: IEEE Access (2019)

Keyphrases

spatial information
prediction accuracy
spatial structure
spatio temporal
data structure
image compression
spatial data
tree structure
hierarchical structure
spatial distribution
data sets
neural network
image analysis
spatial databases
fractal dimension