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First adhesion measurements of conductive ultrananocrystalline diamond MEMS sidewalls.

Federico BujaJaap KokorianAnirudha V. SumantW. Merlijn van Spengen
Published in: NEMS (2014)
Keyphrases
  • measurement data
  • wide range
  • measurement noise
  • databases
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  • artificial neural networks
  • measured data
  • measurement errors