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Test Pattern Generation for Analog Circuits Using Neural Networks and Evolutive Algorithms.
José Luis Bernier
Juan Julián Merelo Guervós
Julio Ortega
Alberto Prieto
Published in:
IWANN (1995)
Keyphrases
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neural network
analog circuits
pattern recognition
computational cost
orders of magnitude
decision making
data structure
significant improvement
computationally efficient
theoretical analysis
genetic algorithm
learning algorithm
computational complexity
evolutionary algorithm