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A Low-Voltage Measurement Testbed for Metrological Characterization of Algorithms for Phasor Measurement Units.

Mario LuisoDavid MaciiPietro TosatoDavide BrunelliDaniele GalloCarmine Landi
Published in: IEEE Trans. Instrum. Meas. (2018)
Keyphrases
  • low voltage
  • real time
  • low cost
  • design considerations
  • pattern recognition
  • digital images
  • object oriented