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The Failure Analysis of High Voltage Tolerance IO Buffer under ESD.

Tao ChengY. S. Shyu
Published in: Microelectron. Reliab. (2004)
Keyphrases
  • high voltage
  • data analysis
  • statistical analysis
  • data mining
  • real time
  • reinforcement learning
  • evolutionary algorithm
  • state space
  • case based reasoning
  • data mining techniques