A Practical Inductor Loss Testing Scheme and Device With High Frequency Pulsewidth Modulation Excitations.
Baiyi LiuWei ChenJinghui WangQingbin ChenPublished in: IEEE Trans. Ind. Electron. (2021)
Keyphrases
- high frequency
- low frequency
- visual quality
- high resolution
- high frequencies
- wavelet transform
- subband
- discrete wavelet transform
- wavelet decomposition
- low pass
- wavelet coefficients
- wavelet domain
- blocking artifacts
- multiresolution
- frequency band
- high frequency components
- frequency domain
- remote sensing
- multi resolution analysis
- low bit rate coding