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Non-linear width scaling of ESD protection devices and link with p-well implant in BCD-processes.

Edgar H. T. OlthofG. J. de Raad
Published in: Microelectron. Reliab. (2008)
Keyphrases
  • process model
  • processing capabilities
  • artificial intelligence
  • mobile devices
  • electronic devices
  • computational models
  • smart phones
  • handheld devices
  • security level