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Generalization of Forgery Detection With Meta Deepfake Detection Model.

Van-Nhan TranSeong-Geun KwonSuk-Hwan LeeHoanh-Su LeKi-Ryong Kwon
Published in: IEEE Access (2023)
Keyphrases
  • probability distribution
  • multiscale
  • computational complexity
  • wavelet transform
  • maximum likelihood