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Analysis and parameterization of L-band microwave emission from exponentially correlated rough surface.

Tianjie ZhaoJiancheng ShiDongyang LiArnaud MialonYann KerrDabin JiTianxing WangChuan Xiong
Published in: IGARSS (2014)
Keyphrases
  • three dimensional
  • quantitative analysis
  • computer vision
  • d objects
  • statistical analysis
  • neural network
  • image processing
  • data analysis
  • relational databases
  • image analysis
  • rough sets
  • frequency band