A Design and Yield Evaluation Technique for Wafer-Scale Memory.
Koichi YamashitaShohei IkeharaPublished in: Computer (1992)
Keyphrases
- case study
- design space
- memory requirements
- neural network
- memory space
- information retrieval systems
- data mining
- database
- image processing
- information systems
- case based reasoning
- artificial intelligence
- software architecture
- evaluation method
- computational power
- real world
- product design
- memory size
- semiconductor manufacturing