ESD Robustness of GaN-on-Si Power Devices under Substrate Biases by means of TLP/VFTLP Tests.

Wen Yang Nicholas Stoll Jiann-Shiun Yuan

Published in: IRPS (2020)

Keyphrases

semiconductor devices
mobile devices
power consumption
computational efficiency
computer simulation
high robustness
electronic devices
power management
embedded devices
electric vehicles
database
context aware
image analysis
video sequences
database systems
data sets
real time