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Diagnosis of Voltage Dependent Scan Chain Failure Using VBUMP Scan Debug Method.
Khairul Khusyari
Wei Tee Ng
Neal Jaarsma
Robert Abraham
Peng Weng Ng
Boon Hui Ang
Chin Hu Ong
Published in:
ATS (2008)
Keyphrases
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significant improvement
clustering method
objective function
prior knowledge
similarity measure
cost function
experimental evaluation
detection method
high precision
pairwise
color images
support vector machine svm
synthetic data
classification method
scan data