Redundancy analysis simulation in semiconductor manufacturing for yield improvement.
Youngshin HanChilgee LeeJason J. JungPublished in: SpringSim (2009)
Keyphrases
- semiconductor manufacturing
- discrete event simulation
- social networks
- numerical analysis
- mathematical analysis
- natural language
- significant improvement
- stochastic simulation
- neural network
- automatic analysis
- process control
- simulation model
- statistical analysis
- evolutionary algorithm
- multiscale
- image segmentation
- decision making
- computer vision
- learning algorithm