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A Compact High-Dimensional Yield Analysis Method using Low-Rank Tensor Approximation.
Xiao Shi
Hao Yan
Qiancun Huang
Chengzhen Xuan
Lei He
Longxing Shi
Published in:
ACM Trans. Design Autom. Electr. Syst. (2022)
Keyphrases
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low rank
high order
high dimensional
missing data
higher order
data sets
image processing
similarity measure
active learning
data points
trace norm