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ATREX : Design for Testability System for Mega Gate LSIs.
Michiaki Emori
Junko Kumagai
Koichi Itaya
Takashi Aikyo
Tomoko Anan
Junichi Niimi
Published in:
Asian Test Symposium (1997)
Keyphrases
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neural network
search engine
data sets
case study
design process
software architecture
information retrieval
image processing
conceptual framework