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Vietoris-Rips and Cech Complexes of Metric Gluings.
Michal Adamaszek
Henry Adams
Ellen Gasparovic
Maria Gommel
Emilie Purvine
Radmila Sazdanovic
Bei Wang
Yusu Wang
Lori Ziegelmeier
Published in:
CoRR (2017)
Keyphrases
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metric space
critical points
evaluation metrics
metric learning
color quantization
databases
machine learning
euclidean distance
database
learning algorithm
computer vision
error metrics
minimum risk