An 80μVrms-temporal-noise 82dB-dynamic-range CMOS Image Sensor with a 13-to-19b variable-resolution column-parallel folding-integration/cyclic ADC.
Min-Woong SeoSungho SuhTetsuya IidaHiroshi WatanabeTaishi TakasawaTomoyuki AkahoriKeigo IsobeTakashi WatanabeShinya ItohShoji KawahitoPublished in: ISSCC (2011)
Keyphrases
- dynamic range
- cmos image sensor
- variable resolution
- signal to noise ratio
- wide dynamic range
- multiresolution
- high dynamic range
- parallel processing
- single chip
- image sensor
- transfer function
- spatially varying
- solid state
- fully integrated
- space time
- image structure
- d objects
- processing capabilities
- multiscale
- computer vision