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Developments of new concept analytical instruments for failure analyses of sub-100 nm devices.

Yasuhiro MitsuiFumiko YanoHiroshi KakibayashiHiroyasu ShichiTakashi Aoyama
Published in: Microelectron. Reliab. (2001)
Keyphrases
  • mobile devices
  • data sets
  • search engine
  • computer vision
  • real time
  • knowledge base
  • case study
  • evolutionary algorithm
  • statistical analysis
  • context aware
  • concept lattice
  • comparative analysis