In-Line-Test of Variability and Bit-Error-Rate of HfOx-Based Resistive Memory.

B. L. Ji H. Li Q. Ye S. Gausepohl S. Deora D. Veksler S. Vivekanand H. Chong H. Stamper T. Burroughs C. Johnson M. Smalley S. Bennett V. Kaushik J. Piccirillo M. Rodgers M. Passaro M. Liehr

Published in: CoRR (2015)

Keyphrases