Login / Signup

Open-circuit voltage decay: moving to a flexible method of characterisation.

Antoine LemaireArnaud PeronaMatthieu CaussanelHerve DuvalAlain Dollet
Published in: IET Circuits Devices Syst. (2020)
Keyphrases
  • preprocessing
  • dynamic programming
  • classification method
  • data sets
  • objective function
  • cost function
  • high precision
  • support vector machine
  • clustering method
  • synthetic data