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Empirically Estimable Classification Bounds Based on a Nonparametric Divergence Measure.

Visar BerishaAlan WislerAlfred O. Hero IIIAndreas Spanias
Published in: IEEE Trans. Signal Process. (2016)
Keyphrases
  • pattern recognition
  • feature extraction
  • feature selection
  • support vector
  • feature vectors
  • density estimation
  • divergence measure
  • image processing
  • bayesian networks