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A test pattern selection method for a joint bounded-distance and encoding-based decoding algorithm of binary codes [Transactions Letters].

Hitoshi TokushigeMarc P. C. FossorierTadao Kasami
Published in: IEEE Trans. Commun. (2010)
Keyphrases
  • dynamic programming
  • hamming distance
  • pairwise
  • decoding algorithm
  • binary codes
  • probabilistic model
  • energy function
  • optimization method
  • data sets
  • feature extraction
  • input data