All-Digital VCO-ADC TAD Using 4CKES-Type in 16-nm FinFET CMOS for Technology Scaling With Stochastic-ADC Method.
Takamoto WatanabePublished in: ICECS (2021)
Keyphrases
- significant improvement
- high precision
- pairwise
- synthetic data
- preprocessing
- high accuracy
- computational complexity
- experimental evaluation
- support vector machine
- classification method
- low power
- neural network
- high order
- mathematical model
- support vector machine svm
- image registration
- computational cost
- objective function
- image segmentation