Identifying Wafer-Level Systematic Failure Patterns via Unsupervised Learning.
Mohamed Baker AlawiehFa WangXin LiPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2018)
Keyphrases
- unsupervised learning
- abstraction levels
- supervised learning
- temporal patterns
- pattern mining
- data mining techniques
- maximum likelihood
- root cause
- massively parallel
- lower level
- design patterns
- higher level
- artificial intelligence
- low level
- training set
- bayesian networks
- image processing
- feature selection
- information systems
- computer vision