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The Future of Industrial Statistics: A Panel Discussion.

David M. SteinbergSøren BisgaardNecip DoganaksoyNicholas FisherBert GunterGerald J. HahnSallie Keller-McNultyJon R. KettenringWilliam Q. MeekerDouglas C. MontgomeryC. F. Jeff Wu
Published in: Technometrics (2008)
Keyphrases
  • panel discussion
  • long term
  • industrial applications
  • industrial environment
  • real world
  • machine learning
  • artificial intelligence in medicine
  • data sets
  • information retrieval
  • high level
  • similarity measure