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Characterization of the EME of integrated circuits with the help of the IEC standard 61967 [electromagnetic emission].

Timm OstermannBernd Deutschmann
Published in: ETW (2003)
Keyphrases
  • integrated circuit
  • control system
  • high frequency
  • data mining
  • real time
  • neural network
  • real world
  • information retrieval
  • image processing
  • decision trees
  • bayesian networks
  • multiresolution
  • printed circuit boards