Applications of the Thermal Step Method to the Characterization of Electric Charge in MOS Components.
Olivier FruchierPetru Notingher Jr.Serge AgnelAlain ToureilleF. ForestS. CunninghamBernard RoussetJ.-L. SanchezPublished in: IAS (2007)
Keyphrases
- computational cost
- computationally efficient
- cost function
- classification method
- similarity measure
- synthetic data
- theoretical analysis
- significant improvement
- feature selection
- high precision
- detection method
- support vector machine svm
- experimental evaluation
- prior knowledge
- objective function
- clustering algorithm
- data sets
- high accuracy
- input data
- evolutionary algorithm
- pairwise
- computational complexity
- infrared
- matching algorithm
- optimization method