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Applications of the Thermal Step Method to the Characterization of Electric Charge in MOS Components.
Olivier Fruchier
Petru Notingher Jr.
Serge Agnel
Alain Toureille
F. Forest
S. Cunningham
Bernard Rousset
J.-L. Sanchez
Published in:
IAS (2007)
Keyphrases
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computational cost
computationally efficient
cost function
classification method
similarity measure
synthetic data
theoretical analysis
significant improvement
feature selection
high precision
detection method
support vector machine svm
experimental evaluation
prior knowledge
objective function
clustering algorithm
data sets
high accuracy
input data
evolutionary algorithm
pairwise
computational complexity
infrared
matching algorithm
optimization method