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Two-dimensional analytical threshold voltage model for nanoscale graded channel gate stack DG MOSFETs.

Mohamed Amir AbdiFayçal DjeffalMohammed MeguellatiDjemai Arar
Published in: ICECS (2009)
Keyphrases
  • experimental data
  • probabilistic model
  • statistical model
  • neural network
  • high level
  • objective function
  • prior knowledge
  • data sets
  • learning algorithm
  • control system
  • multi dimensional
  • parameter estimation