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Two-dimensional analytical threshold voltage model for nanoscale graded channel gate stack DG MOSFETs.
Mohamed Amir Abdi
Fayçal Djeffal
Mohammed Meguellati
Djemai Arar
Published in:
ICECS (2009)
Keyphrases
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experimental data
probabilistic model
statistical model
neural network
high level
objective function
prior knowledge
data sets
learning algorithm
control system
multi dimensional
parameter estimation