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A sensitivity and linearity improvement of a 100-dB dynamic range CMOS image sensor using a lateral overflow integration capacitor.

Nana AkahaneShigetoshi SugawaSatoru AdachiKazuya MoriToshiyuki IshiuchiKoichi Mizobuchi
Published in: IEEE J. Solid State Circuits (2006)
Keyphrases
  • dynamic range
  • cmos image sensor
  • high dynamic range
  • spatially varying
  • image sensor
  • single chip
  • fully integrated
  • signal to noise ratio
  • parallel processing
  • transfer function
  • solid state
  • image quality