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Detecting technological maturity from bibliometric patterns.
Katherine Cauthen
Prashant Rai
Nicholas Hale
Laura J. Freeman
Jaideep Ray
Published in:
Expert Syst. Appl. (2022)
Keyphrases
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automatic detection
image processing
artificial neural networks
data mining techniques
frequent patterns
neural network
real world
machine learning
website
data streams
expert systems
design patterns
pattern discovery
pattern analysis
spatial patterns
complex patterns