Subtle Anomaly Detection of Microscopic Probes using Deep learning based Image Completion.
Kosuke IkedaKeith SchaubIra LeventhalYiorgos MakrisConstantinos XanthopoulosDeepika NeethirajanPublished in: ITC (2019)
Keyphrases
- anomaly detection
- deep learning
- image completion
- unsupervised learning
- global optimization
- texture synthesis
- intrusion detection
- image analysis
- machine learning
- supervised learning
- detect anomalies
- refinement process
- mental models
- weakly supervised
- semi supervised
- object recognition
- expectation maximization
- object detection
- computer vision