IEEE 1149.1 Based Defect and Fault Tolerant Scan Chain for Wafer Scale Integration.

Meng Lu Yvon Savaria Bing Qiu Jacques Taillefer

Published in: DFT (2003)

Keyphrases

fault tolerant
fault tolerance
distributed systems
high availability
load balancing
state machine
massively parallel
integrated circuit
safety critical
semiconductor manufacturing
databases
data model
expert systems
digital libraries
multi agent systems
multi agent
data replication