A 28-nm 1R1W Two-Port 8T SRAM Macro With Screening Circuitry Against Read Disturbance and Wordline Coupling Noise Failures.
Makoto YabuuchiYasumasa TsukamotoHidehiro FujiwaraMiki TanakaShinji TanakaKoji NiiPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2018)