Automated cryo-electron microscopy.

Clinton S. Potter D. Fellmann Ron A. Milligan Jim Pulokas Christian Suloway Yuanxin Zhu A. Carragher

Published in: ISBI (2002)

Keyphrases

semi automated
automated classification
real time
wide range
data sets
databases
machine learning
feature selection
lower bound
image analysis
high resolution
high throughput
context sensitive
fully automated
automated analysis
microscopy images