A New Method for Measurement of Low-Frequency Noise of MOSFET.

Ashkan Roshan-Zamir Shahin Jafarabadi-Ashtiani

Published in: IEEE Trans. Instrum. Meas. (2013)

Keyphrases

low frequency
high frequency
machine learning
subband
similarity measure
computational complexity
feature space
high resolution
image data
noisy data
low pass