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A Combinatorial Method for the Evaluation of Yield of Fault-Tolerant Systems-on-Chip.

Doru P. MunteanuVíctor SuñéRosa Rodríguez-MontañésJuan A. Carrasco
Published in: DSN (2003)
Keyphrases
  • fault tolerant
  • distributed systems
  • evaluation method
  • fault tolerance
  • detection method
  • low cost
  • sensor networks
  • intelligent systems
  • computer systems
  • evaluation model
  • high availability