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Cross-Layer Analysis of Multi-Static RFID Systems Exploiting Capture Diversity.

Roberto ValentiniPiergiuseppe Di MarcoRoberto AlesiiFortunato Santucci
Published in: IEEE Trans. Commun. (2021)
Keyphrases
  • cross layer
  • rfid systems
  • data management
  • context aware
  • key technologies
  • supply chain management