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SRAM read current variability and its dependence on transistor statistics.
Sriramkumar Venugopalan
Vivek Joshi
Luis Zamudio
Matthias Goldbach
Gert Burbach
Ralf Van Bentum
Sriram Balasubramanian
Published in:
CICC (2013)
Keyphrases
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power consumption
low power
confidence intervals
real time
decision trees
low cost
future development