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SRAM read current variability and its dependence on transistor statistics.

Sriramkumar VenugopalanVivek JoshiLuis ZamudioMatthias GoldbachGert BurbachRalf Van BentumSriram Balasubramanian
Published in: CICC (2013)
Keyphrases
  • power consumption
  • low power
  • confidence intervals
  • real time
  • decision trees
  • low cost
  • future development