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Bias Analysis of a Certain Problem with Applications to E0 and Shannon Cipher.

Yi LuYvo Desmedt
Published in: ICISC (2010)
Keyphrases
  • image processing
  • data analysis
  • expert systems
  • automatic analysis
  • machine learning
  • high level
  • database systems
  • wide range
  • image analysis
  • multiresolution
  • statistical analysis