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Test pattern generation using thermometer code counter in TPC technique for BIST implementation.

K. JamalKamsali Manjunatha ChariP. Srihari
Published in: Microprocess. Microsystems (2019)
Keyphrases
  • efficient implementation
  • source code
  • industry standard
  • real time
  • neural network
  • implementation issues
  • face images
  • implementation details